标准号 |
中文名称 |
英文名称 |
| DIN 50131-1974 |
金属材料的检验.收缩率测定法 |
(Testing of Metallic Materials; Determination of Shrinkage) |
| DIN 50141-1982 |
金属材料的检验；剪切试验 |
(Testing of metals; Shear test) |
| DIN 50142-1982 |
金属材料的检验；扁平弯曲振动试验 |
(Testing of metallic materials; Flat bending fatigue test) |
| DIN 50148-1975 |
有色金属压铸件的拉伸试验 |
(Tensile test pieces for non-ferrous metals pressure die castings) |
| DIN 50150-2000 |
金属材料试验.硬度值的换算 |
(Testing of metallic materials - Conversion of hardness values) |
| DIN 50154-1980 |
对厚度在0.179mm以下的铝和铝塑性合金薄膜和带材进行不作微调拉伸测量的拉力试验 |
(Tensile test without extensometer on foils and strips of aluminium and wrought aluminium alloys with a thickness up to 0,179 mm) |
| DIN 5016-1994 |
商务表格.供货计划表 |
(Business forms - Delivery schedule) |
| DIN 50162-1978 |
镀层钢的检验.剪切试验中镀层材料与母体材料之间的粘附剪切强度的测定 |
(Testing of clad steels; determination of shear strength between cladding metal and parent metal in shear test) |
| DIN 50165-1994 |
金属材料试验.点焊连接的抗振强度试验 |
(Testing of metallic materials - Vibration strength test on single spot welding joints) |
| DIN 5017-1992 |
业务表格.检验报告 |
(Business forms; inspection report) |
| DIN 5018-1994 |
商务表格.发货定单 |
(Business forms - Despatch order) |
| DIN 5018-2004 |
商务表格.货物发送细则 |
|
| DIN 5019-1998 |
商务表格.集合发票 |
(Business forms - Collective invoice) |
| DIN 50190-2-1979 |
热处理件的硬化深度.表面淬火硬化深度的测定 |
(Hardness depth of heat-treated parts; determination of the effective depth of hardening after flame or induction hardening) |
| DIN 50190-3-1979 |
热处理件的硬化深度.氮化处理硬化深度的测定 |
(Hardness depth of heat-treated parts; determination of the effective depth of hardening after nitriding) |
| DIN 50190-4-1999 |
激光技术.热处理件的硬化深度.第4部分:熔炼硬化深度和熔炼深度的测定 |
(Hardness depth of heat-treated parts - Part 4: Determination of the fusion hardening depth and the fusion depth) |
| DIN 50192-1977 |
脱碳深度的测定 |
(Determination of depth of decarburization) |
| DIN 502-1973 |
传动件.用两个螺钉紧固的法兰轴承 |
(Driving Components; Flanged Bearings, Fastened with 2 Screws) |
| DIN 502-2004 |
传动件.用两个螺钉紧固的法兰轴承 |
|
| DIN 5023-1989 |
涂盖色料用颜料盒 |
(Painting box with opaque colours) |
| DIN 50280-1975 |
向心滑动轴承的运行试验.概述 |
(Running Test on Radial Plain Bearings; General) |
| DIN 50282-1979 |
滑动轴承.金属滑动材料的摩擦特性.特性概念 |
(Plain Bearings; The Tribological Behaviour of Metallic Antifriction Materials; Significant Definitions) |
| DIN 503-1973 |
传动件.用四个螺钉紧固的法兰轴承 |
(Driving Components; Flanged Bearings, Fastened with 4 Screws) |
| DIN 503-2004 |
传动件.用四个螺钉紧固的法兰轴承 |
|
| DIN 5030-1-1985 |
辐射的光谱测量.概念.量.参数 |
(Spectral measurement of radiation; terminology, quantities, characteristic values) |
| DIN 5030-2-1982 |
辐射的光谱测量.光谱测量的光源.选择标准 |
(Spectral measurement of radiation; radiation sources; selection criteria) |
| DIN 5030-3-1984 |
辐射的光谱测量.光谱分离.概念及特性标志 |
(Spectral measurement of radiation; spectral isolation; definitions and characteristics) |
| DIN 5030-5-1987 |
辐射光谱的测量.光谱辐射测量用物理的接收器.概念.特性值.选择依据 |
(Spectral measurement of radiation; physical detectors for spectral measurement of radiation; terminology, characteristic quantities, selection criteria) |
| DIN 5031 Bb.1-1982 |
光学范围内的辐射物理学和照明技术.DIN5031T.1-T.10的量.公式符号.单位及主题词索引 |
(Optical radiation physics and illumination engineering; quantities, symbols and units; table of contents and catchword index to DIN 5031) |
| DIN 5031-1-1982 |
光学范围内的辐射物理学和照明技术.量.公式符号幅射物理单位 |
(Optical radiation physics and illuminating engineering; quantities, symbols and units of radiation physics) |
| DIN 5031-10-2000 |
光辐射物理学和照明技术.第10部分:光生物学上的有效辐射、量、公式符号和作用 |
(Optical radiation physics and illuminating engineering - Part 10: Photobiologically effective radiation, quantities, symbols and actions) |
| DIN 5031-2-1982 |
光学范围内的辐射物理学及照明技术.用接收器评定辐射 |
(Optical radiation physics and illuminating engineering; evaluation of radiation by different detectors) |
| DIN 5031-3-1982 |
光学范围内的辐射物理学及照明技术.照明技术的量.符号及单位 |
(Optical radiation physics and illuminating engineering; quantities, symbols and units of illuminating engineering) |
| DIN 5031-4-1982 |
光学范围内的辐射物理学及照明技术.效率 |
(Physics of radiation in the field of optics and illuminating engineering; efficiencies) |
| DIN 5031-5-1982 |
光学范围内的辐射物理学及照明技术.温度概念 |
(Physics of radiation in the field of optics and illuminating engineering; definitions for temperatures) |
| DIN 5031-6-1982 |
光学范围内的辐射物理学及照明技术.以瞳孔光强作为网膜照度的量度 |
(Physics of radiation in the field of optics and illuminating engineering; pupil intensity as a measure of retinal illumination) |
| DIN 5031-7-1984 |
光学范围内的辐射物理学及照明技术.波长范围的名称 |
(Optical radiation physics and illumination engineering; terms for wavebands) |
| DIN 5031-8-1982 |
光学范围内的辐射物理学及照明技术.辐射物理学的概念和常数 |
(Physics of radiation in the field of optics and illuminating engineering; definitions and constants of radiation physics) |
| DIN 5031-9-1982 |
光学范围内的辐射物理学及照明技术.有关发光的概念 |
(Physics of radiation in the field of optics and illuminating engineering; definitions in the field of luminescence) |
| DIN 50312-1977 |
喷丸检验.压力喷射用检验箱 |
(Testing of abrasives; test cabin for pressure-type blasting) |
| DIN 50315-1988 |
金属离心喷射试验.磨损试验.效果检验 |
(Testing the wear and effectiveness of metallic abrasives by centrifugal blasting) |
| DIN 5032-1-1999 |
光测量.第1部分:光度测量法 |
(Photometry - Part 1: Methods of measurement) |
| DIN 5032-2-1992 |
光测量.电灯照明和相关量值的测量 |
(Photometry; operation of electric lamps and measurement of the respective quantities) |
| DIN 5032-3-1976 |
光测量.气体光源的测量条件 |
(Photometry; terms of measurement on gas luminaires) |
| DIN 5032-4-1999 |
光测量.第4部分:光源测量 |
(Photometry - Part 4: Measurement of luminaires) |
| DIN 5032-6-1985 |
光测量.光度计.概念.特性及其标志 |
(Photometry; photometers; concepts, characteristics and their designation) |
| DIN 5032-7-1985 |
光测量.照明强度和照明密度的分级 |
(Photometry; classification of illuminance meters and luminance meters) |
| DIN 5032-8-1986 |
光测量.照明强度测量设备用的数据表 |
(Photometry; data-sheet for illuminance-meters) |
| DIN 5033-1-1979 |
色度测定.色度基本概念 |
(Colorimetry; basic concepts) |
| DIN 5033-2-1992 |
色度测定.标准色价系统 |
(Colorimetry; standard colorimetric systems) |
| DIN 5033-3-1992 |
色度测量.色度数 |
(Colorimetry; colorimetric measures) |
| DIN 5033-4-1992 |
色度测量.光谱法 |
(Colorimetry; spectrophotometric method) |
| DIN 5033-5-1981 |
色度测定.目测比色法 |
(Colorimetry by visual matching) |
| DIN 5033-6-1976 |
色度测定.三色法 |
(Colorimetry; tristimulus method) |
| DIN 5033-7-1983 |
色度测定.物体色的测量条件 |
(Colorimetry; measuring conditions for object colours) |
| DIN 5033-8-1982 |
色度测定.光源的测量条件 |
(Colorimetry; measuring conditions for light sources) |
| DIN 5033-9-1982 |
色度测定.色度测定和光度测定的白色标准 |
(Colorimetry; reflectance standard for colorimetry and photometry) |
| DIN 5033-9-2005 |
色度测量.第9部分:色度测量和光度测量的校准用反射标准 |
|
| DIN 5034-1-1999 |
室内日光照明.第1部分:一般要求 |
(Daylight in interiors - Part 1: General requirements) |
| DIN 5034-2-1985 |
室内日光照明.原理 |
(Daylight in interiors; principles) |
| DIN 5034-3-1994 |
室内日光照明.第3部分:计算 |
(Daylight in interiors - Part 3: Calculation) |
| DIN 5034-4-1994 |
室内日光照明.第4部分:居室最小窗户尺寸的简化测定 |
(Daylight in interiors - Part 4: Simplified determination of minimum window sizes for dwellings) |
| DIN 5034-5-1993 |
室内日光照明.测量 |
(Daylight in interiors; measurement) |
| DIN 5034-6-1995 |
室内日光照明.屋顶天窗采光孔的有用尺寸的简要规定 |
(Daylight in interiors - Part 6: Simplified determination of suitable dimensions for rooflights) |
| DIN 5035-6-1990 |
室内人工照明.测量和评定 |
(Artificial lighting; measurement and evaluation) |
| DIN 5035-7-2004 |
人工照明.第7部分:带可视工作站的室内照明 |
|
| DIN 5035-8-1994 |
人工照明.办公室和类似办公室的房间中个别场所照明的特殊要求 |
(Artificial lighting; special requirements for the lighting of single work-places in offices and similar rooms) |
| DIN 5036 Bb.1-1980 |
材料的辐射物理学性能和光技术性能.目次和主题词索引 |
(Radiometric and photometric properties of materials; table of content, catchword index) |
| DIN 5036-1-1978 |
材料的辐射物理学性能和光技术性能.概念.特性值 |
(Radiometric and photometric properties of materials; definitions characteristics) |
| DIN 5036-3-1979 |
材料的辐射物理学性能和光技术性能.光技术和光谱幅射物理学参数的测量方法 |
(Radiometric and photometric properties of materials; methods of measurement for photometric and spectral radiometric characteristics) |
| DIN 5036-4-1977 |
材料的辐射物理学性能和光技术性能.分级 |
(Radiometric and photometric properties of materials; classification) |
| DIN 5037 Bb.1-1992 |
聚光灯的光学鉴定.电影、电视和旋转对称光线强度分配的舞台聚光灯的合理可用光鉴定 |
(Photometric evaluation of projectors; simplified evaluation of projectors with rotationally symmetrical luminous intensity distribution for the use in film and television studios and stages) |
| DIN 5037 Bb.2-1992 |
聚光灯的光学鉴定.带一个或两个对称光强度分布的电影、电视和舞台聚光灯合理的可用光的鉴定 |
(Photometric evaluation of projectors; simplified evaluation of projectors with non-rotationally symmetrical luminous intensity distribution for use in film and television studios and stages) |
| DIN 5039-1995 |
光.灯.光源.概念.分类 |
(Light, lamps, luminaires - Definitions, survey) |
| DIN 504-1973 |
传动件.套筒轴承 |
(Driving Components; Eye-mounted Bearings) |
| DIN 504-2004 |
传动件.套筒轴承 |
|
| DIN 5040-1-1976 |
照明用灯.光技术标志和分类 |
(Luminaires (lighting fittings); classification) |
| DIN 5040-2-1995 |
照明用灯.第2部分:室内照明灯.概念.分类 |
(Luminaires (lighting fittings) - Part 2: Luminaires for interior lighting; concepts, classification) |
| DIN 5040-3-1977 |
照明用灯.室外照明灯.概念.分类 |
(Luminaires (lighting fittings); luminaires for outdoor lighting, concepts, classification) |
| DIN 5040-4-1999 |
照明用灯.第4部分:照明探照灯.术语和光技术评估值 |
(Luminary for lighting purposes - Part 4: Flood lights, terms and quantities of assessment) |
| DIN 5042-1-1980 |
燃气灯和煤气灯.分类.概念 |
(Gaslamps and lighting fittings; definition, classification) |
| DIN 5042-2-1974 |
燃气灯和煤气灯.陶瓷喷嘴.尺寸 |
(Gaslamps and lighting fittings; ceramic mouthpieces) |
| DIN 5042-3-1980 |
燃气灯和煤气灯.白炽灯罩.尺寸 |
(Gaslamps and lighting fittings; incandescent mantle) |
| DIN 5042-4-1994 |
燃气灯和煤气灯.街道照明用白炽灯罩.要求和检验 |
(Combustion lamps and gas luminaires; incandescent mantle for roadlighting; requirements and testing) |
| DIN 5042-5-1979 |
燃气灯和煤气灯.点火喷嘴.吊挂结构:A型 |
(Gaslamps and lighting fittings; ignition burner, hanging structure) |
| DIN 5042-6-1979 |
燃气灯和煤气灯.点火喷嘴.立式结构 |
(Gaslamps and lighting fittings; ignition burner, upright structure) |
| DIN 5042-7-1988 |
燃气灯和煤气灯.固定喷嘴 |
(Combustion lamps and gas luminaires; fixed nozzles) |
| DIN 5042-8-1985 |
燃气灯和煤气灯.空气调节用喷射管和锁紧螺母 |
(Combustion lights and gas lights; injector jet pipes and air control screws) |
| DIN 5043-1-1973 |
放射性发光颜料与发光染料.发光密度的测量条件和颜料符号 |
(Radioactive luminous pigments; methods of mesurement and designation) |
| DIN 5043-2-1978 |
放射性发光颜料与发光染料.发光密度的测量条件和发光染料的符号 |
(Radioactive luminescent pigments and paints; method of measurement of luminance and designation of luminescent paints) |
| DIN 50431-1988 |
半导体工艺材料的检验.用探针线性排列的四探针直流法测量单晶硅或锗的电阻率 |
(Testing of semiconductor materials; measurement of the resistivity of silicon or germanium single crystals by means of the four probe/direct current method with collinear array) |
| DIN 50433-1-1976 |
无机半导体材料的检验.用X射线测向仪测定单晶体取向 |
(Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of X-ray diffraction) |
| DIN 50433-2-1976 |
无机半导体材料的检验.用反射光影法测定单晶体取向 |
(Testing of semi-conducting inorganic materials; determining the orientation of single crystals by means of optical reflection figure) |
| DIN 50433-3-1982 |
半导体材料的检验.用劳埃反射法测定单晶体取向 |
(Testing of materials for semiconductor technology; determination of the orientation of single crystals by means of Laue back scattering) |
| DIN 50434-1986 |
半导体材料的检验.单晶硅试样的(111)和(100)蚀面上晶体结构缺陷的测定 |
(Testing of materials for semiconductor technology; detection of crystal defects in monocrystalline silicon using etching techniques on 111 and 100 surfaces) |
| DIN 50435-1988 |
半导体工艺材料的检验.用探针四探针直流法测量硅片和锗片电阻率的径向变化 |
(Testing of semiconductor materials; determination of the radial resistivity variation of silicon or germanium slices by means of the four-probe/direct current method) |
| DIN 50437-1979 |
无机半导体材料的检验.用红外线干涉法测量硅外延生长层的的厚度 |
(Testing of semi-conductive inorganic materials; measuring the thickness of silicon epitaxial layer thickness by infrared interference method) |
| DIN 50438-1-1995 |
半导体工艺材料的检验.用红外线吸收法测量硅中杂质含量.第1部分:氧 |
(Testing of materials for semiconductor technology - Determination of impurity content in silicon by infrared absorption - Part 1: Oxygen) |
| DIN 50438-2-1982 |
半导体工艺材料的检验.用红外线吸收法测量硅中杂质含量.碳 |
(Testing of materials for semiconductor technology; determination of impurty content in silicon by infrared absorption; carbon) |
| DIN 50438-3-2000 |
半导体工艺材料的试验.用红外线吸收法测量硅中杂质含量.第3部分:硼和磷 |
(Testing of materials for use in semiconductor technology - Determination of impurity content silicon by infrared absorption - Part 3: Boron and phosphorus) |
| DIN 50439-1982 |
半导体工艺材料的检验.用电容--电压法和水银接点确定晶朊半导体材料中掺杂物的断面 |
(Testing of materials for semiconductor technology; determination of the dopant concentration profile of single crystalline semiconductor material by means of the capacitancevoltage method and mercury contact) |
| DIN 5044-1-1981 |
固定交通照明.汽车交通的道路照明.一般质量特性和标准值 |
(Stationary traffic lighting; street lighting for automobile traffic) |
| DIN 5044-2-1982 |
固定交通照明.汽车交通的道路照明.计算和测量 |
(Stationary traffic lighting; street lighting for automobile traffic; calculation and measurement) |
| DIN 50440-1998 |
半导体工艺材料的检验.测量硅单晶中载流子寿命.用光电导法在微小喷射时测量复合载流子寿命 |
(Testing of materials for semiconductor technology - Measurement of carrier lifetime in silicon single crystals - Recombination carrier lifetime at low injection by photoconductivity method) |
| DIN 50441-1-1996 |
半导体工艺材料的检验.半导体片几何尺寸的测量.第1部分:厚度和厚度变动 |
(Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 1: Thickness and thickness variation) |
| DIN 50441-2-1998 |
半导体工艺材料的检验.半导体芯片几何尺寸的测量.第2部分:棱角剖面的检验 |
(Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 2: Testing of edge profile) |
| DIN 50441-3-1985 |
半导体工艺材料的检验.半导体片几何尺寸的测量.用多射线干涉法测定抛光片表面的平面偏差 |
(Testing of materials for semiconductor technology; measurement of the geometric dimensions of semiconductor slices; determination of flatness deviation of polished slices by means of the multiple beam interference) |
| DIN 50441-4-1999 |
半导体工艺用材料的检验.半导体圆片几何尺寸的测量.第4部分:圆片直径,直径变化,扁片直径,扁片长度和扁片厚 |
(Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 4: Slice diameter, diamter variation, flat diameter, flat length, flat depth) |
| DIN 50441-5-2001 |
半导体工艺材料的试验.半导体片几何尺寸的测定.第5部分:形状和平整度偏差的术语 |
(Testing of materials for semiconductor technology - Determination of the geometric dimensions of semiconductor wafers - Part 5: Terms of shape and flatness deviation) |
| DIN 50442-1-1981 |
无机半导体材料的检验.圆形单晶体半导体片表面结构的测定.锯切和研磨的薄片 |
(Testing of semi-conductive inorganic materials; determination of the surface structure of circular monocrystalline semi-conductive slices; as-cut and lapped slices) |
| DIN 50443-1-1988 |
半导体工艺材料的检验.用X射线外形测量法证明半导体单晶体中晶体缺陷和不均匀性.硅 |
(Testing of materials for use in semiconductor technology; detection of crystal defects and inhomogeneities in silicon single crystals by X-ray topography) |
| DIN 50443-2-1994 |
半导体工艺用材料的检验.用X射线局部剖析法在半导体单晶中验证晶体缺陷和不均匀性.III-V-连接式半导体 |
(Testing of materials for semiconductor technology; recognition of defects and inhomogeneities in semiconductor single crystals by X-ray topography; III-V-semiconductor compounds) |
| DIN 50445-1992 |
半导体工艺材料检验.用涡流法无接触测定特种电阻.均匀掺杂半导体片 |
(Testing of materials for semiconductor technology; contactless determination of the electrical resistivity of semiconductor slices with the eddy current method; homogeneously doped semiconductor wafers) |
| DIN 50446-1995 |
半导体工艺材料的检验.硅晶体外延层中缺陷种类和缺陷密度测定 |
(Testing of materials for semiconductor technology - Determination of defect types and defect densities of silicon epitaxial layers) |
| DIN 50447-1995 |
半导体工艺材料的检验.用涡流法无接触测量半导体层的表面电阻 |
(Testing of materials for semiconductor technology - Contactless determination of the electrical sheet resistance of semiconductor layers with the eddy-current method) |
| DIN 50448-1998 |
半导体工艺材料的检验.用电容试探器无接触测量半绝缘半导体圆片 |
(Testing of materials for semiconductor technology - Contactless determination of the electrical resistivity of semi-insulating semi-conductor slices using a capacitive probe) |
| DIN 50449-1-1997 |
半导体工艺用材料的检验.通过红外线吸收在Ⅲ-Ⅴ-连接半导体中杂质含量的测定.第1部分:砷化镓中的碳素 |
(Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 1: Carbon in gallium arsenide) |
| DIN 50449-2-1998 |
半导体工艺用材料的检验.通过红外线吸收在Ⅲ-Ⅴ-连接半导体中杂质含量的测定.第2部分:砷化镓中的硼 |
(Testing of materials for semiconductor technology - Determination of impurity content in semiconductors by infrared absorption - Part 2: Boron in gallium arsenide) |
| DIN 50450-1-1987 |
半导体工艺材料的检验.载运气体和混合气体中杂质的测定.用五氧化二磷电池测定氢.氧.氮.氙和氦中的水杂质 |
(Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of water impurity in hydrogen, oxygen, nitrogen, argon and helium by using a diphosphorus pentoxide cell) |
| DIN 50450-2-1991 |
半导体工艺材料的检验.载运气体和混合气体中杂质的测定.用原电池测定氮.氩.氦.氖.氢中的氧杂质 |
(Testing of materials for semiconductor technology; determination of impurities in carrier gases and doping gases; determination of oxygen impurity in N, Ar, He, Ne and H by using a galvanic cell) |
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